Published May 15, 2015
| Version v1
Journal article
Structural examination of the interface between Au catalysts and Ge(1 1 1)
Creators
- 1. Laboratoire de Physique des Couches Minces et des Matériaux pour l'Electronique (LPCM2E), Université d'Oran, BP 1524 El'Mnaouer, Oran 31100 (Algeria)
- 2. IS2M, Université de Haute Alsace, CNRS-UMR7361, F-68057 Mulhouse (France)
- 3. Aix-Marseille Université, CINaM-CNRS, Campus de Luminy, Case 913, F-13288 Marseille Cedex 9 (France)
Description
We investigate the interface between Au catalysts and a Ge(1 1 1) substrate. This system is achieved by dewetting an Au layer above the Au–Ge eutectic temperature. We show by high resolution transmission electron microscopy that a large amount of Ge can be moved over a surface of Ge(1 1 1) by using assistance of eutectic Au–Ge droplets. This localization is achieved thanks to the ability of nano Au–Ge droplets to incorporate a large amount of Ge and to release it by cooling down the sample at room temperature. This makes the localization process irreversible with respect to annealing at a very high temperature. The extra Ge supplied by precipitation is in epitaxy with the Ge(1 1 1) substrate. This reflects in macroscopic I(V) measurements
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2015.03.006Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2015.03.006;
- PII
- S1359-6454(15)00163-9;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 90
- Journal Page Range
- p. 310-317
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47022488
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; CATALYSTS; DROPLETS; EPITAXY; EUTECTICS; GERMANIUM; GOLD; INTERFACES; LAYERS; PRECIPITATION; RESOLUTION; SUBSTRATES; SURFACES; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CRYSTAL GROWTH METHODS; ELECTRON MICROSCOPY; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; PARTICLES; SEPARATION PROCESSES; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.