Published November 22, 2006
| Version v1
Journal article
Density Matrix Approach to Description of Doubly Excited States in Dense Plasmas
- 1. HEPTI, RRC 'Kurchatov institute', Kurchatov Square 1, Moscow 123182 (Russian Federation)
- 2. Universite de Provence et CNRS, UMR 6633, Centre de Saint Jerome, case 232, PIIM, Avenue Escadrille Normandie-Niemen, F-13397 Marseille cedex 20 (France)
Description
The density matrix approach allows to consider self-consistently the atomic kinetics and radiation dynamics in one closed system of equations. This approach is typical for laser physics, but for Stark broadening by plasmas it was introduced in the beginning of ninetieth. The present work is aimed on the specifics of such description for the located above ionization threshold doubly excited states (DES) of multiply charged ions. The Stark profiles of dielectronic satellites, originating from DES, play an important role in the diagnostic implementations. The existence of nonlinear interference effects (NIEF) in the Stark profiles of dielectronic satellites of multiply charged ions is demonstrated in the frames of the three-level model
Additional details
Identifiers
- DOI
- 10.1063/1.2402758;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 874
- Journal Issue
- 1
- Journal Page Range
- p. 112-126
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 18. international conference on spectral line shapes
- Dates
- 4-9 Jun 2006
- Place
- Auburn, AL (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38058675
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DENSITY MATRIX; EQUATIONS; EXCITED STATES; IONIZATION; LINE BROADENING; MULTICHARGED IONS; NONLINEAR PROBLEMS; PLASMA; PLASMA DENSITY; PLASMA SIMULATION; STARK EFFECT
- Descriptors DEC
- CHARGED PARTICLES; ENERGY LEVELS; IONS; MATRICES; SIMULATION
Optional Information
- Notes
- (c) 2006 American Institute of Physics