Published April 15, 1983 | Version v1
Journal article

Sagital focusing of synchrotron radiation

  • 1. Cornell Univ., Ithaca, NY (USA). School of Applied and Engineering Physics
  • 2. Cornell Univ., Ithaca, NY (USA). Cornell High Energy Synchrotron Source

Description

We describe a simple device that has successfully been used to sagittally focus about 2.5 mrad of synchrotron radiation with an energy resolution equivalent to that of a double crystal channel cut monochromator. Deep narrow slots are cut into a 6 mm thick silicon crystal wafer cut into a triangular shape. The slots leave a connecting link of 0.25 mm thickness. The triangular shape allows a simple means of providing a cylindrical surface approximated polygonally by the thick crystal segments between the narrow slots. The device was tested with 10 and 15 keV synchrotron radiation on one of the CHESS white beam lines at a magnification of 1/3 as suggested by Sparks et al. At both energies the diffracted beam power in the bent crystal was equivalent to that in the unbent state to within a few percent. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res.
Journal Volume
208
Journal Issue
1-3
Series
Nucl. Instrum. Methods Phys. Res.
Journal Page Range
327-331
ISSN
0029-554X

Conference

Title
International conference on X-Ray and VUV synchrotron radiation instrumentation.
Dates
9-13 Aug 1982.
Place
Hamburg (Germany, F.R.).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
14796226
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM OPTICS; CRYSTALS; FOCUSING; PHOTON BEAMS; RADIATION SOURCES; SILICON; SYNCHROTRON RADIATION; X RADIATION
Descriptors DEC
BEAMS; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; RADIATIONS; SEMIMETALS