Measure the constituents of geological samples by XRF intensity influence coefficient method
- 1. Chengdu Univ. of Technology, Chengdu (China)
Description
The elements of some ore samples (including primary ores in the mine) have been measured by using the Si-PIN detector and the portable high energy resolution XRF analyzer with an embedded computer constituting the intensity correction model of influence coefficient method. By comparing to the result by chemical analysis, the conclusion could be made as follows: the maximal relative error of the content of the element Fe with the content between 20% to 55% is not more than 4.74%, the maximal relative error of the content of the element Cu with the content between 182ppm to 2400ppm is not more than 24. 70% and not more than 7.46% with the content between 2400ppm to 3600ppm, the maximal relative error of the content of the element Zn with the content between 556ppm to 3200ppm is not more than 25. 93% and not more than 4.74% with the content between 3200ppm to 21600ppm, the maximal relative error of the content of the element Pb with the content between 5900ppm to 204200ppm is not more than 23.80% and not more than 13.79% with the content between 204200ppm to 511200ppm. In this way, this model could overcome the influence of matrix effect from base material components commendably and guide the work of mineral beneficiation in the mine effectively. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 28
- Journal Issue
- 2
- Journal Page Range
- p. 425-429
- ISSN
- 0258-0934
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 41064803
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; COMPUTERS; COPPER; CORRECTIONS; DATA COVARIANCES; ENERGY RESOLUTION; IRON; JUNCTION DETECTORS; LEAD; MEASURING METHODS; ORE COMPOSITION; PORTABLE EQUIPMENT; SI SEMICONDUCTOR DETECTORS; X-RAY FLUORESCENCE ANALYZERS; ZINC
- Descriptors DEC
- ELEMENTS; EQUIPMENT; EVALUATION; MEASURING INSTRUMENTS; METALS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; TRANSITION ELEMENTS
Optional Information
- Notes
- 6 figs., 6 refs.