Published December 2011 | Version v1
Journal article

Modeling of the out-of-plane resistivity of cuprate superconductors

  • 1. Department of Physics, University of Rajshahi, Rajshahi 6205 (Bangladesh)
  • 2. Department of CSE, International Islamic University, Chittagong (Bangladesh)
  • 3. Cambridge Flow Solutions Ltd., Histon, Cambridge CB24 9AD (United Kingdom)

Description

The c-axis resistivity, ρc(T), of high-Tc cuprates have been modeled in this study. ρc(T) was described by considering the pseudogap and a quantum critical point (QCP). This simple phenomenological model describes the experimental data remarkably well. The pseudogap energy scale, εg, was extracted from the analysis of the ρc(T) data. The out-of-plane (c-axis) resistivity, ρc(T), of high-Tc cuprates have been modeled in this study. The non-Fermi liquid like temperature dependence of ρc(T) has been described by considering (i) the full impact of the pseudogap (PG) in the electronic density of states (EDOS) and (ii) the presence of a quantum critical point (QCP) beneath the superconducting dome at slightly overdoped region. This simple phenomenological model describes the experimental ρc(T) data over a wide range of hole content (from the underdoped to slightly overdoped regions) remarkably well. The PG energy scale, εg (dominated by the anti-nodal parts of the Brillouin zone) extracted from the analysis of ρc(T) data was found to decrease almost linearly with increasing hole concentration, p, in the CuO2 planes. We have also discussed about the possible origin of more conventional behavior of ρc(T) observed in the deeply overdoped side of the T–p phase diagram in this paper.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physc.2011.09.001

Additional details

Identifiers

DOI
10.1016/j.physc.2011.09.001;
PII
S0921-4534(11)00411-4;

Publishing Information

Journal Title
Physica. C, Superconductivity
Journal Volume
471
Journal Issue
23-24
Journal Page Range
p. 1598-1601
ISSN
0921-4534
CODEN
PHYCE6

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.