Temperature anomalies of electric resistance and thermo electromotive force in plastically deformed polycrystalline copper

Electric resistivity, r, and thermo electromotive force (TEMF) of commercial Cu samples subjected to plastic strain at room temperature were measured at temperatures ranged from 4.2 to 300 K. A number of mutually correlated dislocation-induced anomalies were detected in the temperature dependences r and TEMF. It is likely that the anomalies are caused by the resonance scattering of free electrons and thermal phonons by dislocation-localized electrons