Development of sample exchange system PAM-HC for longer wavelength X-ray beamline PF/BL-1A
- 1. High Energy Accelerator Research Organization (KEK), Applied Research Laboratory, Mechanical Engineering Center, Tsukuba, Ibaraki (Japan)
- 2. High Energy Accelerator Research Organization (KEK), Institute of Materials Structure Science, Structural Biology Research Center, Tsukuba, Ibaraki (Japan)
Description
Sample exchange system is one of key technologies for folly-automated data collection at synchrotron beamlines. The structural biology research center of the Photon Factory (PF) has developed and operated sample exchange system PAM (PF Automated Mounting system) at macromolecular crystallography beamlines of PF and PF-AR. BL-1A has been built for longer wavelength experiments and opened for users since 2010. We also installed the PAM at BL-1A. In order to decrease absorption of diffraction signal by air, we covered whole diffractometer with a helium chamber recently. In parallel with development of the chamber, we developed a new sample exchange system PAM-HC. The PAM-HC can mount and dismount samples through a tunnel in a side of the chamber. We have opened the PAM-RC in October, 2014. (author)
Additional details
Additional titles
- Original title (Japanese)
- 長波長X線ビームラインPF/BL-1A用試料交換システムPAM-HCの開発
Identifiers
Publishing Information
- Imprint Title
- Proceedings of the 16th KEK mechanical engineering workshop
- Imprint Pagination
- 109 p.
- Journal Page Range
- p. 18-20
- Report number
- KEK-PROC--2015-1
Conference
- Title
- 16. KEK mechanical engineering workshop
- Dates
- 10 Apr 2015
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 55092358
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- AUTOMATION; CRYOGENICS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; HELIUM; INTERNATIONAL COOPERATION; KEK PHOTON FACTORY; PROTEIN STRUCTURE; SYNCHROTRON RADIATION; THERMOCOUPLES; WAVELENGTHS; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; COHERENT SCATTERING; COOPERATION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; MEASURING INSTRUMENTS; NONMETALS; RADIATION SOURCES; RADIATIONS; RARE GASES; SCATTERING; SYNCHROTRON RADIATION SOURCES
Optional Information
- Notes
- 7 refs., 5 figs. Imprint:#7B2C#16#56DE##9AD8##30A8##30CD##7814##30E1##30AB##FF65##30EF##30FC##30AF##30B7##30E7##30C3##30D7##5831##544A##96C6#