Damage threshold of coating materials on x-ray mirror for x-ray free electron laser
Creators
- 1. RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-Cho, Sayo-Gun, Hyogo 679-5148 (Japan)
- 2. Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo-Cho, Sayo-Gun, Hyogo 679-5198 (Japan)
- 3. Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871 (Japan)
Description
We evaluated the damage threshold of coating materials such as Mo, Ru, Rh, W, and Pt on Si substrates, and that of uncoated Si substrate, for mirror optics of X-ray free electron lasers (XFELs). Focused 1 μm (full width at half maximum) XFEL pulses with the energies of 5.5 and 10 keV, generated by the SPring-8 angstrom compact free electron laser (SACLA), were irradiated under the grazing incidence condition. The damage thresholds were evaluated by in situ measurements of X-ray reflectivity degradation during irradiation by multiple pulses. The measured damage fluences below the critical angles were sufficiently high compared with the unfocused SACLA beam fluence. Rh coating was adopted for two mirror systems of SACLA. One system was a beamline transport mirror system that was partially coated with Rh for optional utilization of a pink beam in the photon energy range of more than 20 keV. The other was an improved version of the 1 μm focusing mirror system, and no damage was observed after one year of operation.
Additional details
Identifiers
- DOI
- 10.1063/1.4950723;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 87
- Journal Issue
- 5
- Journal Page Range
- vp.
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48042551
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAMS; COMPARATIVE EVALUATIONS; DAMAGE; ELECTRONS; FREE ELECTRON LASERS; GRAZING; IRRADIATION; KEV RANGE; MIRRORS; OPTICS; PHOTONS; PULSES; REFLECTIVITY; SPRING-8 STORAGE RING; SUBSTRATES; X RADIATION
- Descriptors DEC
- BOSONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; EVALUATION; FEEDING; FERMIONS; IONIZING RADIATIONS; LASERS; LEPTONS; MASSLESS PARTICLES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; STORAGE RINGS; SURFACE PROPERTIES; SYNCHROTRON RADIATION SOURCES
Optional Information
- Notes
- (c) 2016 Author(s)