The study of metal-oxide sol-gel nanocomposites using scanning probe microscopy and X-ray photoelectron spectroscopy
- 1. Voronezh State University, Universitetskaya pl. 1, Voronezh, 394006 (Russian Federation)
- 2. St. Petersburg State Electrotechnical University, st. Prof. Popova 5, St. Petersburg, 197376 (Russian Federation)
- 3. Physico-Technical Institute of Ural Department of RAN, Kirova st. 132, 426000, Izhevsk (Russian Federation)
Description
With the use of atomic-force microscopy (AFM) technique and X-ray photoelectron spectroscopy (XPS) morphology and composition of the surface in SnO2-SiO2 nanocomposites were investigated. The samples were obtained by sol-gel method for their use as sensor agents. It was found that the obtained nanocomposites differ from each other as by the distribution of cluster sizes at the surface layer as by the pores size in a dependence on the composition and preparation technique. The study by X-ray photoelectron microscopy demonstrated that in the composites obtained with the use of the above-named technique tin was present mainly in the form of dioxide with a little admixture of non-oxidized metallic tin. This fact can have a certain impact on the functional characteristics of the sensor structures. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1038/1/012045Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1038
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- International Conference PhysicA.SPb/2017
- Dates
- 24-26 Oct 2017
- Place
- Saint-Petersburg (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53011095
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; LAYERS; MORPHOLOGY; NANOCOMPOSITES; PROBES; SENSORS; SILICA; SILICON OXIDES; SOL-GEL PROCESS; SURFACES; TIN; TIN OXIDES; X RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; IONIZING RADIATIONS; MATERIALS; METALS; MICROSCOPY; MINERALS; NANOMATERIALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SILICON COMPOUNDS; SPECTROSCOPY; TIN COMPOUNDS