Published May 25, 2016 | Version v1
Journal article

Structural characterization of epitaxial LiFe5O8 thin films grown by chemical vapor deposition

  • 1. Chemistry and Physics of Materials Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore, 560064 (India)
  • 2. International Centre for Materials Science, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore, 560064 (India)
  • 3. Center for Materials for Information Technology, University of Alabama, Tuscaloosa, Alabama, 35487 (United States)

Description

We report on detailed microstructural and atomic ordering characterization by transmission electron microscopy in epitaxial LiFe5O8 (LFO) thin films grown by chemical vapor deposition (CVD) on MgO (001) substrates. The experimental results of LFO thin films are compared with those for bulk LFO single crystal. Electron diffraction studies indicate weak long-range ordering in LFO (α-phase) thin films in comparison to bulk crystal where strong ordering is observed in optimally annealed samples. The degree of long-range ordering depends on the growth conditions and the thickness of the film. Annealing experiment along with diffraction study confirms the formation of α-Fe2O3 phase in some regions of the films. This suggests that under certain growth conditions γ-Fe2O3-like phase forms in some pockets in the as-grown LFO thin films that then convert to α-Fe2O3 on annealing. - Highlights: • Atomic ordering in LiFe5O8 bulk single crystal and epitaxial thin films. • Electron diffraction studies reveal different level of ordering in the system. • Formation of γ-Fe2O3 like phase has been observed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2016.01.217

Additional details

Identifiers

DOI
10.1016/j.jallcom.2016.01.217;
PII
S0925-8388(16)30218-3;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
668
Journal Page Range
p. 187-193
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.