The pn-CCD on-chip electronics
Creators
- Pinotti, E.1
- Braeuninger, H.1
- Findeis, N.1
- Gorke, H.1
- Hauff, D.1
- Holl, P.1
- Kemmer, J.1
- Lechner, P.1
- Lutz, G.1
- Kink, W.1
- Meidinger, N.1
- Metzner, G.1
- Predehl, P.1
- Reppin, C.1
- Strueder, L.1
- Truemper, J.1
- Zanthier, C. v.1
- Kendziorra, E.2
- Staubert, R.2
- Radeka, V.3
- Rehak, P.3
- Bertuccio, G.4
- Gatti, E.4
- Longoni, A.4
- Pullia, A.4
- Sampietro, M.4
- 1. MPI Halbleiterlab., Muenchen (Germany)
- 2. Astronomical Inst., Univ. Tuebingen (Germany)
- 3. Brookhaven National Lab., Upton, NY (United States)
- 4. Politecnico di Milano (Italy)
Description
A new pn-CCD with an activa area of 3x1 cm2 was recently fabricated for ESA's X-ray Multi Mirror Mission (XMM). The front-end electronics has been integrated on the same chip as the detector, and its noise behaviour was investigated. X-rays from a 55Fe source have been used for the absolute calibration. The measured electronic Equivalent Noise Charge (ENC) of the on-chip amplifier was 8.8 e- at room temperature and 2.2 e- at the CCD operating temperature of 150 K. The improvements with respect to the last version with noise figures of 4.8 e- (at 150 K) are due to the reduction of the total input capacitance by a factor of 1.6, the improvement of the transistor transconductance by a factor of 2, and the reduction of 1/f noise because of the different p-well implant with a better thermal annealing. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A
- Journal Volume
- 326
- Journal Issue
- 1/2
- Journal Page Range
- p. 85-91.
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- New developments on radiation detectors.
- Acronym
- 6. European symposium on semiconductor detectors
- Dates
- 24-26 Feb 1992.
- Place
- Milan (Italy).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 24036261
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; BACKGROUND NOISE; CALIBRATION; CAPACITANCE; CHARGE-COUPLED DEVICES; ELECTRIC CONDUCTIVITY; ELECTRON CAPTURE DECAY; ENERGY SPECTRA; FIELD EFFECT TRANSISTORS; INTEGRATED CIRCUITS; ION IMPLANTATION; IRON 55; KEV RANGE 01-10; LEAKAGE CURRENT; P-N JUNCTIONS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SILICON; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K; X-RAY DETECTION; X-RAY SPECTRA
- Descriptors DEC
- BETA DECAY; BETA DECAY RADIOISOTOPES; CURRENTS; DECAY; DETECTION; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELECTRON CAPTURE RADIOISOTOPES; ELECTRONIC CIRCUITS; ELEMENTS; ENERGY RANGE; EVEN-ODD NUCLEI; HEAT TREATMENTS; INTERMEDIATE MASS NUCLEI; IRON ISOTOPES; ISOTOPES; KEV RANGE; MEASURING INSTRUMENTS; NOISE; NUCLEAR DECAY; NUCLEI; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATION DETECTORS; RADIOISOTOPES; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR JUNCTIONS; SEMIMETALS; SPECTRA; TEMPERATURE RANGE; TRANSISTORS; YEARS LIVING RADIOISOTOPES