Space-charge-limited magnetoresistance in organic semiconductors
Creators
- 1. School of Science, Shandong Jianzhu University, Jinan 250101 (China)
Description
We present a two-site model for large magnetic field effect on current of nonmagnetic organic semiconductor, based on bipolaron formation in the presence of both hyperfine field and an applied magnetic field. Under the framework of space-charge-limited current, we derived our current density and magnetoresistance expression. The magnetoresistance fit well with the Lorentzian empirical law. We discuss all parameters involved in, and elucidate the origin of positive and negative magnetoresistance under our model. -- Highlights: ► The MR model is based on formation of bipolaron in the presence of hyperfine field. ► Carrier hopping occurs via a limited number of percolation paths. ► A magnetic field lifts probability of parallel spin thus obstructs polaron hopping. ► The MR fit well with the Lorentzian empirical law. ► The sign of magnetoresistance depends on mobility of bipolarons to polarons.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physleta.2011.10.035Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2011.10.035;
- PII
- S0375-9601(11)01281-3;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 376
- Journal Issue
- 1
- Journal Page Range
- p. 56-58
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45056294
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CARRIERS; CURRENT DENSITY; CURRENTS; ELEVATORS; MAGNETIC FIELDS; MAGNETORESISTANCE; MOBILITY; ORGANIC SEMICONDUCTORS; ORIGIN; POLARONS; SPACE CHARGE; SPIN
- Descriptors DEC
- ANGULAR MOMENTUM; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; MATERIALS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; QUASI PARTICLES; SEMICONDUCTOR MATERIALS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.