Application of charge coupled devices as spatially-resolved detectors for X-ray spectrograph
Creators
- 1. Ecole Polytechnique, Palaiseau (France)
- 2. Inst. for Thermonuclear and Innovation Investigations, Troitsk (Russian Federation)
Description
An X-ray crystal spectrograph which contains a CCD linear array as the position-sensitive detector is described. Radiation detection is performed directly onto CCD. The spectrograph has a limit of sensitivity at about 2 J/(A.ster), spectral resolution about 1000 and dynamic range 100-120. The device operates on-line with IBM-PC based control system. Software provides all data acquisition and treatment. Output spectra are presented in absolute units. The device was used during composite Z-pinch experiments at pulse-power installations ''Angara-5-1'' (TRINITI, Troitsk, Russia) and ''GAEL'' (Ecole Polytechnique, Palaiseau, France). Currently the spectrograph is included in the set of diagnostics of the ''Angara-5-1'' facility. Some of the spectra obtained are presented and discussed. (author). 4 figs., 9 refs
Files
28055929.pdf
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Additional details
Publishing Information
- Imprint Title
- Beams '96. Proceedings of the 11th international conference on high power particle beams. Vol. II
- Imprint Pagination
- [692 p.].
- Journal Page Range
- p. 1064-1067.
- Report number
- INIS-CZ--0003
Conference
- Title
- 11. international conference on high power particle beams.
- Acronym
- Beams' 96
- Dates
- 10-14 Jun 1996.
- Place
- Prague (Czech Republic).
INIS
- Country of Publication
- Czech Republic
- Country of Input or Organization
- Czech Republic
- INIS RN
- 28055929
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; CHARGE-COUPLED DEVICES; ELECTRON DENSITY; ELECTRON TEMPERATURE; HOT PLASMA; LONGITUDINAL PINCH; PLASMA DIAGNOSTICS; SOFT X RADIATION; SPATIAL RESOLUTION; X-RAY DETECTION; X-RAY SPECTRA; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
- Descriptors DEC
- DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; METALS; PINCH EFFECT; PLASMA; RADIATION DETECTION; RADIATIONS; RESOLUTION; SEMICONDUCTOR DEVICES; SPECTRA; SPECTROMETERS; SPECTROSCOPY; X RADIATION