Published 2011 | Version v1
Miscellaneous Metadata-only

Ge-K and Se-K -XAFS characterization of collagenous glasses: Ge-Se and Ge-Se-Ag

Creators

  • 1. Universidad Nacional de La Plata, La Plata, Bs.As. (Argentina)
  • 2. Universidad de Buenos Aires, Buenos Aires CapFe (Argentina)

Description

no abstract available

Part of:
Proceedings of the 21. RAU: Annual meeting of the LNLS users. Abstracts of scientific papers

Additional details

Additional titles

Original title (Spanish)
Caracterizacion Ge-K y Se-K -XAFS de vidrios calcogenuros: Ge-Se y Ge-Se-Ag

Publishing Information

Imprint Title
Proceedings of the 21. RAU: Annual meeting of the LNLS users. Abstracts of scientific papers
Imprint Pagination
254 p.
Journal Page Range
p. 170
Report number
INIS-BR--9281

Conference

Title
Annual meeting of the LNLS users
Original Conference Title
21. RAU: Reuniao anual de usuarios do LNLS
Acronym
21. RAU
Dates
22-23 Feb 2011
Place
Campinas, SP (Brazil)

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
42058781
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
No Abstract, Conference
Descriptors DEI
BRAZIL; BRAZILIAN LNLS; CERAMICS; COLLAGEN; CONNECTIVE TISSUE; CYCLOTRON RADIATION; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; GERMANIUM; GLASS; LIGHT SOURCES; POTASSIUM; QUANTITATIVE CHEMICAL ANALYSIS; SELENIUM; SILICON OXIDES; SILVER; SOLIDS; STORAGE RINGS; SYNCHROTRON RADIATION; SYNCHROTRON RADIATION SOURCES; VITRIFICATION; X RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SOURCES
Descriptors DEC
ALKALI METALS; ANIMAL TISSUES; BODY; BRAZILIAN ORGANIZATIONS; BREMSSTRAHLUNG; CHALCOGENIDES; CHEMICAL ANALYSIS; DEVELOPING COUNTRIES; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; EMISSION SPECTROSCOPY; IONIZING RADIATIONS; LATIN AMERICA; LUMINESCENCE; METALS; NATIONAL ORGANIZATIONS; NONDESTRUCTIVE ANALYSIS; ORGANIC COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; PROTEINS; RADIATION SOURCES; RADIATIONS; SCLEROPROTEINS; SEMIMETALS; SILICON COMPOUNDS; SOUTH AMERICA; SPECTROSCOPY; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
Imprint:Anais da 21. RAU: Reuniao anual de usuarios do LNLS. Resumos de trabalhos cientificos