Published August 1, 2011 | Version v1
Journal article

A laser interferometer encoder with two micromachined gratings generating phase-shifted quadrature

  • 1. Department of Mechanical System Engineering, Kumoh National Institute of Technology, 1 Yangho-dong, Gumi, Gyeongbuk 730-701 (Korea, Republic of)
  • 2. Department of Mechanical Engineering, NSF Center for High-Rate Nanomanufacturing, University of Massachusetts, Lowell, MA 01854 (United States)

Description

This paper presents a laser interferometer encoder which generates a quadrature signal by using two gratings with a phase difference. The phase difference comes from an 86 nm step difference between the gratings. The step is about 1/8 of the wavelength of the laser. Thus, two diffracted optical signals generated from the two gratings have about 90° phase difference from each other. The two gratings are fabricated on a quartz wafer with two different periods, 4 and 6 µm, to avoid the overlapping of the two diffraction signals in detection. Simulation results using propagation of an angular spectrum of the laser source through the gratings are compared with experiment results for displacement measurement. The comparison of both results shows very close correlation. It also confirms that the resolution of the developed sensor is 1/8 of the wavelength of the HeNe laser by using the quadrature signals

Availability note (English)

Available from http://dx.doi.org/10.1088/0960-1317/21/8/085036

Additional details

Identifiers

DOI
10.1088/0960-1317/21/8/085036;
PII
S0960-1317(11)87518-2;

Publishing Information

Journal Title
Journal of Micromechanics and Microengineering. Structures, Devices and Systems
Journal Volume
21
Journal Issue
8
Journal Page Range
[9 p.]
ISSN
0960-1317
CODEN
JMMIEZ

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47018445
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
COMPARATIVE EVALUATIONS; DIFFRACTION; GRATINGS; HELIUM-NEON LASERS; INTERFEROMETERS; PHASE SHIFT; QUADRATURES; QUARTZ; SIGNALS; WAVELENGTHS
Descriptors DEC
COHERENT SCATTERING; EVALUATION; GAS LASERS; LASERS; MEASURING INSTRUMENTS; MINERALS; OXIDE MINERALS; SCATTERING