Published August 15, 1974 | Version v1
Journal article Metadata-only

Fast calibration of large Si(Li) electron detectors from 511.0 to 4564.0 keV using double-escape peaks and Compton edges from 66Ga

Creators

  • 1. Michigan State Univ., East Lansing (USA). Cyclotron Lab.

Description

no abstract available

Additional details

Identifiers

DOI
10.1016/0029-554x(74)90127-x;

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
120
Journal Issue
1
Series
Nucl. Instrum. Methods.
Journal Page Range
199-200
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
6158640
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
BETA SPECTROSCOPY; CALIBRATION; COMPTON EFFECT; ELECTRON DETECTION; EXTRAPOLATION; GALLIUM 66; GAMMA SPECTRA; INTERNAL CONVERSION; KEV RANGE 100-1000; LI-DRIFTED SI DETECTORS; MEV RANGE 01-10
Descriptors DEC
BASIC INTERACTIONS; BETA DECAY RADIOISOTOPES; BETA-PLUS DECAY RADIOISOTOPES; CHARGED PARTICLE DETECTION; CONVERSION; DECAY; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ENERGY RANGE; GALLIUM ISOTOPES; HOURS LIVING RADIOISOTOPES; INTERACTIONS; INTERMEDIATE MASS NUCLEI; ISOTOPES; KEV RANGE; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MEV RANGE; NUCLEI; NUMERICAL SOLUTION; ODD-ODD NUCLEI; RADIATION DETECTION; RADIATION DETECTORS; RADIOISOTOPES; SCATTERING; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROSCOPY

Optional Information

Notes
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