Published May 1998 | Version v1
Journal article

High-resolution X-ray topographic images of dislocations in a silicon crystal recorded using an X-ray zooming tube

  • 1. NEC Corporation, Silicon Systems Research Lab., Tsukuba (Japan)
  • 2. Electron Tube Center, Toyooka (Japan)
  • 3. High Energy Accelerator Research Organization, Photon Factory, Tsukuba (Japan)
  • 4. Kansai Medical Univ., Osaka (Japan)

Description

A Be-window-type X-ray zooming tube is an X-ray digital imaging system whose magnification factor of X-ray images can be easily varied from 10 to 200, and whose spatial resolution is less than 0.5 μm. This zooming tube was used as an imaging detector in double-crystal X-ray topography to obtain high-resolution images of dislocations in a silicon crystal. X-ray interference images of about 5 μm were observed even though optimal performance of the X-ray zooming tube could not be achieved. The results indicate that the X-ray zooming tube might make a good detector for X-ray topography with minor improvements in its stage structure

Additional details

Publishing Information

Journal Title
Journal of Synchrotron Radiation
Journal Volume
5
Journal Issue
pt.3
Journal Page Range
p. 1079-1081
ISSN
0909-0495

Conference

Title
6. International conference on Synchrotron Radiation Instrumentation
Acronym
SRI '97
Dates
4-8 Aug 1997
Place
Himeji (Japan)

INIS

Country of Publication
Denmark
Country of Input or Organization
Denmark
INIS RN
29063336
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BERYLLIUM; DISLOCATIONS; SILICON; TOPOGRAPHY; WINDOWS; X-RAY EQUIPMENT
Descriptors DEC
ALKALINE EARTH METALS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; EQUIPMENT; LINE DEFECTS; METALS; OPENINGS; SEMIMETALS

Optional Information

Notes
9 refs.