Published May 1998
| Version v1
Journal article
High-resolution X-ray topographic images of dislocations in a silicon crystal recorded using an X-ray zooming tube
- 1. NEC Corporation, Silicon Systems Research Lab., Tsukuba (Japan)
- 2. Electron Tube Center, Toyooka (Japan)
- 3. High Energy Accelerator Research Organization, Photon Factory, Tsukuba (Japan)
- 4. Kansai Medical Univ., Osaka (Japan)
Description
A Be-window-type X-ray zooming tube is an X-ray digital imaging system whose magnification factor of X-ray images can be easily varied from 10 to 200, and whose spatial resolution is less than 0.5 μm. This zooming tube was used as an imaging detector in double-crystal X-ray topography to obtain high-resolution images of dislocations in a silicon crystal. X-ray interference images of about 5 μm were observed even though optimal performance of the X-ray zooming tube could not be achieved. The results indicate that the X-ray zooming tube might make a good detector for X-ray topography with minor improvements in its stage structure
Additional details
Publishing Information
- Journal Title
- Journal of Synchrotron Radiation
- Journal Volume
- 5
- Journal Issue
- pt.3
- Journal Page Range
- p. 1079-1081
- ISSN
- 0909-0495
Conference
- Title
- 6. International conference on Synchrotron Radiation Instrumentation
- Acronym
- SRI '97
- Dates
- 4-8 Aug 1997
- Place
- Himeji (Japan)
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 29063336
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BERYLLIUM; DISLOCATIONS; SILICON; TOPOGRAPHY; WINDOWS; X-RAY EQUIPMENT
- Descriptors DEC
- ALKALINE EARTH METALS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; EQUIPMENT; LINE DEFECTS; METALS; OPENINGS; SEMIMETALS
Optional Information
- Notes
- 9 refs.