Fabrication and adhesion performance of gold conductive patterns on silicon substrate by laser sintering
Creators
- 1. Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei 430074 (China)
- 2. Department of Industrial and Systems Engineering, Hong Kong Polytechnic University, Hung Hom, Kowloon (Hong Kong)
Description
Laser sintering of gold-microparticle ink was examined in this study. Laser-sintered gold conductive patterns were characterized by using scanning electron microscope (SEM), energy-dispersive spectrometer (EDS), cross-cut tape test and destructive bond wire pull tests. The effects of laser power on microstructure and adhesion of gold conductive patterns were investigated. It was found that the microstructure of gold conductive patterns became denser with increase of laser power. The gold conductive patterns treated with laser power of 2 W showed poor adhesiveness of 2B in accordance with ASTM D3359-08. The adhesion level of gold conductive patterns increased to 5B by elevating laser power to 8 W. The adhesion mechanism of gold conductive patterns on silicon substrate was discussed and wire bonding test was also performed on gold conductive patterns. Wire breakage took place at the practical pull strength of around 5 gf.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2011.08.088Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2011.08.088;
- PII
- S0169-4332(11)01336-5;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 258
- Journal Issue
- 1
- Journal Page Range
- p. 478-481
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44030439
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ADSORPTION; BONDING; EQUIPMENT; GOLD; LASER RADIATION; MICROSTRUCTURE; MICROWAVE RADIATION; PERFORMANCE; SCANNING ELECTRON MICROSCOPY; SILICON; SINTERING; SPECTROMETERS; SUBSTRATES
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FABRICATION; JOINING; MEASURING INSTRUMENTS; METALS; MICROSCOPY; RADIATIONS; SEMIMETALS; SORPTION; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.