Published January 2017 | Version v1
Journal article

Element-resolved Kikuchi pattern measurements of non-centrosymmetric materials

  • 1. Electronic Materials Engineering Department, Research School of Physics and Engineering, The Australian National University, Canberra2601 (Australia)
  • 2. Bruker Nano GmbH, Am Studio 2D, Berlin 12489 (Germany)

Description

Angle-resolved electron Rutherford backscattering (ERBS) measurements using an electrostatic electron energy analyser can provide unique access to element-resolved crystallographic information. We present Kikuchi pattern measurements of the non-centrosymmetric crystal GaP, separately resolving the contributions of electrons backscattered from Ga and P. In comparison to element-integrated measurements like in the method of electron backscatter diffraction (EBSD), the effect of the absence of a proper 4-fold rotation axis in the point group of GaP can be sensed with a much higher visibility via the element-resolved Ga to P intensity ratio. These element-resolved measurements make it possible to experimentally attribute the previously observed point-group dependent effect in element-integrated EBSD measurements to the larger contribution of electrons scattered from Ga compared to P. - Highlights: •Element specific Kikuchi patterns are presented for GaP. •Absence of a proper four-fold rotation axis is demonstrated. •Ga and P intensity variations after 90 degree rotation have opposite phase. •The asymmetry in the total intensity distribution resembles that of Ga.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.matchar.2016.11.043

Additional details

Identifiers

DOI
10.1016/j.matchar.2016.11.043;
PII
S1044-5803(16)31102-0;

Publishing Information

Journal Title
Materials Characterization
Journal Volume
123
Journal Page Range
p. 328-338
ISSN
1044-5803
CODEN
MACHEX

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.