Element-resolved Kikuchi pattern measurements of non-centrosymmetric materials
Creators
- 1. Electronic Materials Engineering Department, Research School of Physics and Engineering, The Australian National University, Canberra2601 (Australia)
- 2. Bruker Nano GmbH, Am Studio 2D, Berlin 12489 (Germany)
Description
Angle-resolved electron Rutherford backscattering (ERBS) measurements using an electrostatic electron energy analyser can provide unique access to element-resolved crystallographic information. We present Kikuchi pattern measurements of the non-centrosymmetric crystal GaP, separately resolving the contributions of electrons backscattered from Ga and P. In comparison to element-integrated measurements like in the method of electron backscatter diffraction (EBSD), the effect of the absence of a proper 4-fold rotation axis in the point group of GaP can be sensed with a much higher visibility via the element-resolved Ga to P intensity ratio. These element-resolved measurements make it possible to experimentally attribute the previously observed point-group dependent effect in element-integrated EBSD measurements to the larger contribution of electrons scattered from Ga compared to P. - Highlights: •Element specific Kikuchi patterns are presented for GaP. •Absence of a proper four-fold rotation axis is demonstrated. •Ga and P intensity variations after 90 degree rotation have opposite phase. •The asymmetry in the total intensity distribution resembles that of Ga.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchar.2016.11.043Additional details
Identifiers
- DOI
- 10.1016/j.matchar.2016.11.043;
- PII
- S1044-5803(16)31102-0;
Publishing Information
- Journal Title
- Materials Characterization
- Journal Volume
- 123
- Journal Page Range
- p. 328-338
- ISSN
- 1044-5803
- CODEN
- MACHEX
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49039010
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ASYMMETRY; BACKSCATTERING; COMPARATIVE EVALUATIONS; CRYSTALLOGRAPHY; CRYSTALS; DISTRIBUTION; ELECTRON DIFFRACTION; ELECTROSTATIC ANALYZERS; GALLIUM PHOSPHIDES; ROTATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SYMMETRY
- Descriptors DEC
- BEAM ANALYZERS; COHERENT SCATTERING; DIFFRACTION; EVALUATION; GALLIUM COMPOUNDS; MOTION; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; SCATTERING; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.