Published June 2004 | Version v1
Journal article

Photosensitivity of APV-films in CdTe-SiO2-Si heterostructure under influence of external electric field

  • 1. Fergana State University, Fergana (Uzbekistan)

Description

Influences of an external stationary electric field and corona discharge field are investigated on photocurrent Ι of short circuit in APV-layer of heterostructure Cd Te-SiO2-Si in a mode of 'field effect'. The residual photosensitivity of the APV- film is revealed caused by volume charges of arisen deep levels in insulator SiO2. Mechanisms of sign inversion of APV and its displacement on spectrum Ι depending on intensity of polarizing insulator of electric field are discussed. (author)

Additional details

Additional titles

Original title (Russian)
Фоточувствительност' AFN- пленок CdTe-SiO

Publishing Information

Journal Title
Uzbekiston Fizika Zhurnali
Journal Volume
6
Journal Issue
1
Journal Page Range
p. 40-45
ISSN
1025-8817

Optional Information

Notes
6 refs., 4 figs