Published January 17, 2007 | Version v1
Journal article

Periodic ferrite-semiconductor layered composite with negative index of refraction

  • 1. Department of Electronic Sciences and Engineering, Nanjing University, Nanjing 210093 (China)
  • 2. Department of Physics and Astronomy, University of Delaware, Newark, DE 19716 (United States)

Description

We have studied the index of refraction of periodic layered semiconductor-ferrite composite. Both the transmission matrix analysis and full-wave simulations confirm the existence of a negative index of refraction in the composite. We find that the magnitude of the negative index of refraction and its frequency range depend on the ratio of the semiconductor and ferrite layer thicknesses and the doping content of the semiconductor. At the long-wave approximation, we have obtained the explicit expression of the effective index of refraction, effective permittivity and effective permeability. The result shows that it is possible to fabricate a uniform negative index material with the layered composite

Additional details

Identifiers

DOI
10.1088/0953-8984/19/2/026211;
PII
S0953-8984(07)29231-8;

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
19
Journal Issue
2
Journal Page Range
p. 026211
ISSN
0953-8984
CODEN
JCOMEL