A novel γ-ray imaging method for the pulse-shape characterization of position sensitive semiconductor radiation detectors

A new technique for the pulse-shape characterization of γ-ray position sensitive germanium detectors is presented. This method combines the pulse shape comparison scan (PSCS) principle with a γ-ray imaging technique. The latter is provided by a supplementary, high performance, position sensitive γ-ray scintillator detector. We describe the basic aspects of the method and we show measurements made for the study of pulse-shapes in a non-segmented planar HPGe detector. A preliminary application of the PSCS is carried out, although a more detailed investigation is being performed with highly segmented position sensitive detectors.