Published 1994
| Version v1
Miscellaneous
Characterization of compound III/V epitaxial layers using multiple X-rays diffraction
Creators
- 1. TELEBRAS, Campinas, SP (Brazil). Centro de Pesquisas
Description
Short communication
Additional details
Additional titles
- Original title (Portuguese)
- Caracterizacao de camadas epitaxiais de compostos III/V usando-se difracao multipla de raios-X
Publishing Information
- Imprint Title
- Proceedings of the 17. national meeting on condensed matter physics: abstracts
- Imprint Pagination
- 427 p.
- Journal Page Range
- p. 74.
Conference
- Title
- 17. Brazilian meeting on condensed matter physics.
- Original Conference Title
- 17. Encontro nacional de fisica da materia condensada
- Dates
- 7-11 Jun 1994.
- Place
- Caxambu, MG (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 27080101
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract, Non-conventional Literature
- Descriptors DEI
- CRYSTAL GROWTH; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; CRYSTALLIZATION; CRYSTALLOGRAPHY; CRYSTALS; DIFFRACTION; EPITAXY; GALLIUM; GALLIUM ARSENIDES; GALLIUM COMPOUNDS; INDIUM; INDIUM PHOSPHIDES; PHOSPHORUS; RADIATIONS; SCATTERING; STRUCTURAL CHEMICAL ANALYSIS; X-RAY DIFFRACTION
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; ELEMENTS; INDIUM COMPOUNDS; METALS; NONMETALS; PHASE TRANSFORMATIONS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES
Optional Information
- Notes
- Imprint:Anais do 17. encontro nacional de fisica da materia condensada: resumos.