Published January 1990 | Version v1
Journal article Metadata-only

Layer thickness determination on coated glasses by X-ray fluorescence analysis

Creators

  • 1. Flachglaskombinat, Torgau (Germany, F.R.)

Description

Described is an emission method free of calibration samples on layer thickness determination of coated glasses by X-ray fluorescence analysis. Presented were possibilities and border lines of the method and experimental conditions. Confronted were wet chemical won layer thicknesses with X-ray fluorescence analysis won thicknesses. (author)

Additional details

Additional titles

Original title (German)
Schichtdickenbestimmung an beschichteten Glaesern mittels Roentgenfluoreszenzanalyse

Publishing Information

Journal Title
Silikattechnik
Journal Volume
41
Journal Issue
1
Series
Silikattechnik.
Journal Page Range
27-28
ISSN
0037-5233
CODEN
SITKA

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
22023028
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Descriptors DEI
ALUMINIUM; COATINGS; COMPARATIVE EVALUATIONS; COPPER; GLASS; LAYERS; SILVER; THICKNESS; TITANIUM; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; DIMENSIONS; ELEMENTS; EVALUATION; METALS; NONDESTRUCTIVE ANALYSIS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS