Published September 2009 | Version v1
Journal article

Hard X-ray micro-spectroscopy at Berliner Elektronenspeicherring fuer Synchrotronstrahlung II

  • 1. Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Elektronenspeicherring BESSY II, Albert-Einstein-Str. 15, 12489 Berlin (Germany)

Description

The capabilities of the X-ray beamlines at Berliner Elektronenspeicherring fuer Synchrotronstrahlung II (BESSY II) for hard X-ray measurements with micro- and nanometer spatial resolution are reviewed. The micro-X-ray fluorescence analysis (micro-XRF), micro-extended X-ray absorption fine structure (micro-EXAFS), micro-X-ray absorption near-edge structure (micro-XANES) as well as X-ray standing wave technique (XSW), X-ray beam induced current (XBIC) in combination with micro-XRF and micro-diffraction as powerful methods for organic and inorganic sample characterization with synchrotron radiation are discussed. Mono and polycapillary optical systems were used for fine X-ray focusing down to 1 μm spot size with monochromatic and white synchrotron radiation. Polycapillary based confocal detection was applied for depth-resolved micro-XRF analysis with a volume resolution down to 3.4 . 10- 6 mm3. Standing wave excitation in waveguides was also applied to nano-EXAFS measurements with depth resolution on the order of 1 nm. Several examples of the methods and its applications in material research, biological investigations and metal-semiconductor interfaces analysis are given.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.sab.2009.07.003

Additional details

Identifiers

DOI
10.1016/j.sab.2009.07.003;
PII
S0584-8547(09)00178-5;

Publishing Information

Journal Title
Spectrochimica Acta. Part B, Atomic Spectroscopy
Journal Volume
64
Journal Issue
9
Journal Page Range
p. 833-848
ISSN
0584-8547
CODEN
SAASBH

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.