Hard X-ray micro-spectroscopy at Berliner Elektronenspeicherring fuer Synchrotronstrahlung II
Creators
- 1. Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Elektronenspeicherring BESSY II, Albert-Einstein-Str. 15, 12489 Berlin (Germany)
Description
The capabilities of the X-ray beamlines at Berliner Elektronenspeicherring fuer Synchrotronstrahlung II (BESSY II) for hard X-ray measurements with micro- and nanometer spatial resolution are reviewed. The micro-X-ray fluorescence analysis (micro-XRF), micro-extended X-ray absorption fine structure (micro-EXAFS), micro-X-ray absorption near-edge structure (micro-XANES) as well as X-ray standing wave technique (XSW), X-ray beam induced current (XBIC) in combination with micro-XRF and micro-diffraction as powerful methods for organic and inorganic sample characterization with synchrotron radiation are discussed. Mono and polycapillary optical systems were used for fine X-ray focusing down to 1 μm spot size with monochromatic and white synchrotron radiation. Polycapillary based confocal detection was applied for depth-resolved micro-XRF analysis with a volume resolution down to 3.4 . 10- 6 mm3. Standing wave excitation in waveguides was also applied to nano-EXAFS measurements with depth resolution on the order of 1 nm. Several examples of the methods and its applications in material research, biological investigations and metal-semiconductor interfaces analysis are given.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.sab.2009.07.003Additional details
Identifiers
- DOI
- 10.1016/j.sab.2009.07.003;
- PII
- S0584-8547(09)00178-5;
Publishing Information
- Journal Title
- Spectrochimica Acta. Part B, Atomic Spectroscopy
- Journal Volume
- 64
- Journal Issue
- 9
- Journal Page Range
- p. 833-848
- ISSN
- 0584-8547
- CODEN
- SAASBH
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41029288
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTROSCOPY; BESSY STORAGE RING; HARD X RADIATION; METALS; MONOCHROMATIC RADIATION; SEMICONDUCTOR MATERIALS; SPATIAL RESOLUTION; STANDING WAVES; SYNCHROTRON RADIATION; WAVEGUIDES; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; MATERIALS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; RESOLUTION; SORPTION; SPECTROSCOPY; STORAGE RINGS; X RADIATION; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.