Effect of irradiation damage on the shear strength of Cu–Nb interfaces
- 1. Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, IL 61801 (United States)
- 2. Frederick Seitz Materials Research Laboratory, University of Illinois Urbana-Champaign, IL 61801 (United States)
Description
The influence of irradiation-induced damage on the interfacial shear strength of Cu–Nb interfaces was characterized via compression of nanolaminate pillars performed in situ in a transmission electron microscope. Chemical mixing and interfacial roughening during MeV Kr ion irradiation leads to increased interfacial shear strength by as much as 60%, from 0.6 GPa for the as-deposited material to 0.95 GPa for samples irradiated at liquid nitrogen temperature. The increase in interfacial shear strength was most pronounced at low temperatures (∼−196 °C), but it is still significant at ∼300 °C. This observation was correlated with increased chemical mixing at lower temperatures, as determined from compositional profiles characterized by energy-dispersive spectroscopy
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2014.07.009Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2014.07.009;
- PII
- S1359-6462(14)00291-7;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 90-91
- Journal Page Range
- p. 29-32
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47011099
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPRESSION; DEPOSITS; ION BEAMS; IRRADIATION; KRYPTON IONS; LIQUIDS; MIXING; NITROGEN; SHEAR PROPERTIES; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELECTRON MICROSCOPY; ELEMENTS; FLUIDS; IONS; MECHANICAL PROPERTIES; MICROSCOPY; NONMETALS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.