Published November 2014 | Version v1
Journal article

Effect of irradiation damage on the shear strength of Cu–Nb interfaces

  • 1. Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, IL 61801 (United States)
  • 2. Frederick Seitz Materials Research Laboratory, University of Illinois Urbana-Champaign, IL 61801 (United States)

Description

The influence of irradiation-induced damage on the interfacial shear strength of Cu–Nb interfaces was characterized via compression of nanolaminate pillars performed in situ in a transmission electron microscope. Chemical mixing and interfacial roughening during MeV Kr ion irradiation leads to increased interfacial shear strength by as much as 60%, from 0.6 GPa for the as-deposited material to 0.95 GPa for samples irradiated at liquid nitrogen temperature. The increase in interfacial shear strength was most pronounced at low temperatures (∼−196 °C), but it is still significant at ∼300 °C. This observation was correlated with increased chemical mixing at lower temperatures, as determined from compositional profiles characterized by energy-dispersive spectroscopy

Availability note (English)

Available from http://dx.doi.org/10.1016/j.scriptamat.2014.07.009

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2014.07.009;
PII
S1359-6462(14)00291-7;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
90-91
Journal Page Range
p. 29-32
ISSN
1359-6462
CODEN
SCMAF7

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47011099
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COMPRESSION; DEPOSITS; ION BEAMS; IRRADIATION; KRYPTON IONS; LIQUIDS; MIXING; NITROGEN; SHEAR PROPERTIES; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
BEAMS; CHARGED PARTICLES; ELECTRON MICROSCOPY; ELEMENTS; FLUIDS; IONS; MECHANICAL PROPERTIES; MICROSCOPY; NONMETALS

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.