Stereological characterization of γ' phase precipitation in CMSX-6 monocrystalline nickel-base superalloy
- 1. Silesian University of Technology, Department of Materials Science, Krasinskiego 8, 40-019 Katowice (Poland)
Description
The purpose of this investigation was to study in detail the means to quantitatively evaluate γ' phase precipitation. Many of the mechanical properties of superalloys are directly influenced by the presence of the γ' (gamma prime) precipitate phase dispersed in a γ matrix phase. The γ' precipitates act as effective barriers to dislocation motion and restrict plastic deformation, particularly at high temperatures. Due to this, it is essential to accurately quantify the γ' precipitate size, volume fraction and distribution. Investigations based on quantitative metallography and image analysis were performed on a monocrystalline nickel-base superalloy taking into consideration various γ' precipitate sizes present in that alloy microstructure. The authors of the present paper propose a new method of quantifying the total volume fraction of the γ' phase applying images of the microstructure with γ' phase precipitates registered using light microscopy, scanning electron microscopy (at two different magnifications) and scanning transmission electron microscopy.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchar.2009.01.023Additional details
Identifiers
- DOI
- 10.1016/j.matchar.2009.01.023;
- PII
- S1044-5803(09)00081-3;
Publishing Information
- Journal Title
- Materials Characterization
- Journal Volume
- 60
- Journal Issue
- 10
- Journal Page Range
- p. 1114-1119
- ISSN
- 1044-5803
- CODEN
- MACHEX
Conference
- Title
- 8. STERMAT international conference on stereology and image analysis in materials science
- Dates
- 2-6 Sep 2008
- Place
- Zakopane (Poland)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44022837
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DISLOCATIONS; HEAT RESISTING ALLOYS; IMAGE PROCESSING; MATRIX MATERIALS; METALLOGRAPHY; MICROSTRUCTURE; NICKEL BASE ALLOYS; OPTICAL MICROSCOPY; PLASTICITY; PRECIPITATION; SCANNING ELECTRON MICROSCOPY; TEMPERATURE DEPENDENCE; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; HEAT RESISTANT MATERIALS; LINE DEFECTS; MATERIALS; MECHANICAL PROPERTIES; MICROSCOPY; NICKEL ALLOYS; PROCESSING; SEPARATION PROCESSES; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.