Published June 2012 | Version v1
Journal article

Quantitative anomalous small-angle X-ray scattering - The determination of chemical concentrations in nano-scale phases

  • 1. Institute of Soft Matter and Functional Materials, Helmholtz-Zentrum, Berlin (Germany)
  • 2. Universitaet Paderborn, Fakultaet fuer Naturwissenschaften, Department Chemie, Paderborn (Germany)
  • 3. Leibniz-Institute IFW Dresden, Institute for Complex Materials, Dresden (Germany)
  • 4. Colorado School of Mines, Golden, CO (United States)

Description

In the last years Anomalous Small-Angle X-ray Scattering became a precise quantitative method resolving scattering contributions two or three orders of magnitude smaller compared to the overall small-angle scattering, which are related to the so-called pure-resonant scattering contribution. Additionally to the structural information precise quantitative information about the different constituents of multi-component systems like the fraction of a chemical component implemented into the materials nano-structures are obtained from these scattering contributions. The application of the Gauss elimination algorithm to the vector equation established by ASAXS measurements at three X-ray energies is demonstrated for three examples from chemistry and solid state physics. All examples deal with the quantitative analysis of the Resonant Invariant (RI-analysis). From the integrals of the pure-resonant scattering contribution the chemical concentrations in nano-scaled phases are determined. In one example the correlated analysis of the Resonant Invariant and the Non-resonant Invariant (NI-analysis) is employed. (authors)

Availability note (English)

Available from doi: <http://dx.doi.org/10.1140/epjst/e2012-01623-2

Additional details

Identifiers

Publishing Information

Journal Title
European Physical Journal. Special Topics
Journal Volume
208
Journal Page Range
p. 259-274
ISSN
1951-6355

Optional Information

Notes
39 refs.