Quantitative anomalous small-angle X-ray scattering - The determination of chemical concentrations in nano-scale phases
- 1. Institute of Soft Matter and Functional Materials, Helmholtz-Zentrum, Berlin (Germany)
- 2. Universitaet Paderborn, Fakultaet fuer Naturwissenschaften, Department Chemie, Paderborn (Germany)
- 3. Leibniz-Institute IFW Dresden, Institute for Complex Materials, Dresden (Germany)
- 4. Colorado School of Mines, Golden, CO (United States)
Description
In the last years Anomalous Small-Angle X-ray Scattering became a precise quantitative method resolving scattering contributions two or three orders of magnitude smaller compared to the overall small-angle scattering, which are related to the so-called pure-resonant scattering contribution. Additionally to the structural information precise quantitative information about the different constituents of multi-component systems like the fraction of a chemical component implemented into the materials nano-structures are obtained from these scattering contributions. The application of the Gauss elimination algorithm to the vector equation established by ASAXS measurements at three X-ray energies is demonstrated for three examples from chemistry and solid state physics. All examples deal with the quantitative analysis of the Resonant Invariant (RI-analysis). From the integrals of the pure-resonant scattering contribution the chemical concentrations in nano-scaled phases are determined. In one example the correlated analysis of the Resonant Invariant and the Non-resonant Invariant (NI-analysis) is employed. (authors)
Availability note (English)
Available from doi: <http://dx.doi.org/10.1140/epjst/e2012-01623-2Additional details
Identifiers
Publishing Information
- Journal Title
- European Physical Journal. Special Topics
- Journal Volume
- 208
- Journal Page Range
- p. 259-274
- ISSN
- 1951-6355
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 44026561
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CHEMICAL COMPOSITION; NANOSTRUCTURES; QUANTITATIVE CHEMICAL ANALYSIS; SMALL ANGLE SCATTERING; X-RAY DIFFRACTION
- Descriptors DEC
- CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; SCATTERING
Optional Information
- Notes
- 39 refs.