Published 1991
| Version v1
Book
Growth mechanism of epitaxial oxide films by laser MBE
- 1. Central Research Lab., Sumitomo Cement Co. Ltd., Toyotomi-cho 585, Funabashi-shi, Chiba 274 (Japan)
- 2. Research Lab. of Engineering Materials, Tokyo Inst. of Technology, Nagatsuta-cho 4259, Midori-ku, Yokohama-shi, Kanagawa 227 (Japan)
Description
This paper reports on crystallographic structure and valence state of CeO2 and Nd2--O3 films deposited by laser MBE on Si substrates investigated by reflection high energy electron diffraction (RHEED) and X-ray photoelectron spectroscopy (XPS). In contrast with epitaxial growth of CeO2(111) and Nd2O3(111) on Si(111), epitaxial films were not obtained on Si(001). Partially reduced mixed valence (4+ and 3+) Ce was indicated to exist by XPS in the cerium oxide film within 2 nm from the interface with Si. Beyond this transition layer, two-dimensional growth of CeO2 film on Si(111) was verified from in situ RHEED and as well as on Si--(001) from XPS measurements
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (United States)
- ISBN
- 1-55899-094-1
- Imprint Title
- Evolution of thin-film and surface microstructure
- Imprint Pagination
- 731 p.
- Journal Page Range
- p. 445-450.
Conference
- Title
- Fall meeting of the Materials Research Society (MRS).
- Dates
- 24 Nov - 1 Dec 1990.
- Place
- Boston, MA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23041980
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERIUM OXIDES; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; LASER RADIATION; NEODYMIUM OXIDES; SILICON; SUBSTRATES; THIN FILMS; VALENCE; X-RAY SPECTRA
- Descriptors DEC
- CERIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; NEODYMIUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; RARE EARTH COMPOUNDS; SCATTERING; SEMIMETALS; SPECTRA
Optional Information
- Secondary number(s)
- CONF-901105--.