Published 2006
| Version v1
Book
Near edge x-ray absorption fine structure of Ni doped LaFeO3 thin film
- 1. Materials Science and Engineering Divison, KIST, Cheongrang, Seoul (Korea, Republic of)
- 2. UGC-DAE, CSR Khandwa Road, University Campus, Indore (India)
- 3. Inter University Accelerator Centre, New Delhi (India)
Description
Electronic structure of LaFe0.7Ni0.3O3 thin film has been studied by near edge x-ray fine structure (NEXAFS) spectra at O K, Fe L3.2 and La M5.4 edges. On substitution of Ni at Fe site in LaFeO3, the O K-edge spectrum show a pre-edge feature starts rising about 2.0 eV lower than that of LaFeO3. This feature is consistent with our previous measurement of bulk samples of the same series. The study of Fe L3.2 edge structure confirm the trivalent state of Fe. The controlled doping of carriers in semiconducting regime and ferromagnetism, propose these types of materials as a promising candidate for spintronics applications. (author)
Additional details
Publishing Information
- Publisher
- Prime Time Education
- Imprint Place
- Mumbai (India)
- ISBN
- 81-8372-030-7
- Imprint Title
- Proceedings of the DAE solid state physics symposium. V. 51
- Imprint Pagination
- 1058 p.
- Journal Page Range
- p. 471-472
Conference
- Title
- 51. DAE solid state physics symposium
- Dates
- 26-30 Dec 2006
- Place
- Bhopal (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 38112574
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL DOPING; EDGE DISLOCATIONS; FINE STRUCTURE; LANTHANUM OXIDES; NICKEL; THIN FILMS; X-RAY SPECTRA
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DISLOCATIONS; ELEMENTS; FILMS; LANTHANUM COMPOUNDS; LINE DEFECTS; METALS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; SPECTRA; TRANSITION ELEMENTS
Optional Information
- Notes
- 3 refs., 1 fig.