Published April 15, 2006 | Version v1
Journal article

Superconducting characteristics of a MgB2 neutron detector fabricated on SiN membrane

  • 1. Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012 (Japan) and Department of Physics and Electronics, Osaka Prefecture University, 1-1 Gakuen-cho, Sakai, Osaka 599-8531 (Japan)
  • 2. Department of Physics and Electronics, Osaka Prefecture University, 1-1 Gakuen-cho, Sakai, Osaka 599-8531 (Japan)
  • 3. Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012 (Japan)
  • 4. Kansai Advanced Research Center, National Institute of Information and Communications Technology, 588-2 Iwaoka-cho, Nishi-ku, Kobe, Hyogo 651-2429 (Japan)
  • 5. Technology Research Institute of Osaka Prefecture, 2-7-1 Ayumino, Izumi, Osaka 594-1157 (Japan)

Description

We report a fabrication process for membrane-structured superconducting MgB2 neutron detectors and measurement of superconducting DC-characteristics. We prepared a MgB2 thin film on a SiN-film-coated Si substrate using multiple-target sputtering system. The 200-nm-thick MgB2 thin film was processed to create meandering lines by e-beam lithography technique, where the line width was 3 μm and the total length reached 6.3 mm. After the front side of the device had been fabricated, the back side of the device was etched with anisotropic Si etching using ethylene diamine pyrocatechol and etching apparatus to increase the sensitivity of the device. The membrane-structured MgB2 device showed good performance of the transition to superconductivity, namely, a T C,onset of 26.24 K, a T C,offset of 26.02 K, ΔT c of 0.22 K, and an RRR of 1.15

Additional details

Identifiers

DOI
10.1016/j.nima.2005.12.130;
PII
S0168-9002(05)02567-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
559
Journal Issue
2
Journal Page Range
p. 763-765
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
11. international workshop on low temperature detectors
Acronym
LTD-11
Dates
31 Jul - 5 Aug 2005
Place
Tokyo (Japan)

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.