Dynamic metrology—an approach to dynamic evaluation of linear time-invariant measurement systems

An approach to dynamic evaluation of measurement systems is presented. On the one hand, it separates physical experiments, analysis and signal processing methods into successive steps of evaluation. On the other hand, the structure allows for resolution of an entire measurement system into its components for dedicated analyses. There is no limitation to particular applications except that it should be possible to model the response of the measurement system with differential equations with constant coefficients. Proposed tools such as estimation of error and uncertainty and direct mapping methods for synthesis of signal restoration filters are new or recently published, while others like system identification are well known but not previously systematically used in the context of calibration