Published May 15, 2004 | Version v1
Journal article

Kinetics of bulk point defects in the growth of nanocavities in crystalline Ge

Description

Nanocavities created in Ge(111) by 5 keV Xe ion irradiation are characterized by ex situ transmission electron microscopy (TEM). Nanocavities with average diameter of 10 nm are observed at 500 deg. C, while nanocavities with average diameter of 2.9 nm are observed at 400 deg. C. The nanocavities grow beyond equilibrium size at 500 deg. C mainly due to absorption of vacancies produced during 5 keV Xe ion irradiation. The sink strengths of the nanocavities and the Ge surface for absorption of interstitials and vacancies are examined to elucidate the growth of the nanocavities in the absence of apparent biased sinks such as dislocations

Additional details

Identifiers

DOI
10.1016/j.apsusc.2004.02.009;
PII
S0169433204001096;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
229
Journal Issue
1-4
Journal Page Range
p. 19-23
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.