Effect of fluorocarbon self-assembled monolayer films on sidewall adhesion and friction of surface micromachines with impacting and sliding contact interfaces
Creators
- 1. Department of Mechanical Engineering, University of California, Berkeley, California 94720 (United States)
Description
A self-assembled monolayer film consisting of fluoro-octyltrichlorosilane (FOTS) was vapor-phase deposited on Si(100) substrates and polycrystalline silicon (polysilicon) surface micromachines. The hydrophobic behavior and structural composition of the FOTS film deposited on Si(100) were investigated by goniometry and X-ray photoelectron spectroscopy, respectively. The effects of contact pressure, relative humidity, temperature, and impact/sliding cycles on the adhesive and friction behavior of uncoated and FOTS-coated polysilicon micromachines (referred to as the Si and FOTS/Si micromachines, respectively) were investigated under controlled loading and environmental conditions. FOTS/Si micromachines demonstrated much lower and stable adhesion than Si micromachines due to the highly hydrophobic and conformal FOTS film. Contrary to Si micromachines, sidewall adhesion of FOTS/Si micromachines demonstrated a weak dependence on relative humidity, temperature, and impact cycles. In addition, FOTS/Si micromachines showed low and stable adhesion and low static friction for significantly more sliding cycles than Si micromachines. The adhesive and static friction characteristics of Si and FOTS/Si micromachines are interpreted in the context of physicochemical surface changes, resulting in the increase of the real area of contact and a hydrophobic-to-hydrophilic transition of the surface chemical characteristics caused by nanoscale surface smoothening and the removal of the organic residue (Si micromachines) or the FOTS film (FOTS/Si micromachines) during repetitive impact and oscillatory sliding of the sidewall surfaces.
Additional details
Identifiers
- DOI
- 10.1063/1.4808099;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 113
- Journal Issue
- 22
- Journal Page Range
- p. 224505-224505.9
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44117462
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ADHESION; ADHESIVES; DEPOSITION; DEPOSITS; FLUORINE COMPOUNDS; HUMIDITY; INTERFACES; NANOSTRUCTURES; ORGANIC COMPOUNDS; POLYCRYSTALS; RESIDUES; SEMICONDUCTOR MATERIALS; SILICON; SLIDING FRICTION; SUBSTRATES; SURFACES; THIN FILMS; VAPORS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CRYSTALS; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; FLUIDS; FRICTION; GASES; HALOGEN COMPOUNDS; MATERIALS; MOISTURE; PHOTOELECTRON SPECTROSCOPY; SEMIMETALS; SPECTROSCOPY
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC