Angular distribution of X-ray emission from resonant coherently excited highly-charged heavy ions
Description
X-rays emitted from resonant coherently excited (RCE) n=2 states of 390 MeV/amu hydrogen-like Ar17+ ions were observed under planar channeling in a Si crystal. The resonance profiles for X-ray emission consisting of two peaks for j=1/2 and j=3/2 are characterized by suppression of the j=1/2 peak. The degeneracy of the n=2 states are removed by Stark effect due to the static crystal field. The RCE probability of these Stark splitted substates differs, reflecting the polarization of the oscillating crystal field. However, the associated alignment was not clearly observed. It is explained by the fact that both polarization of the oscillating crystal field and the wave functions of Stark-mixed n=2 states depend on the distance from the channel center, and the X-ray emission is preferred in a channel center in a crystal
Additional details
Identifiers
- PII
- S0168583X03005767;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 205
- Journal Issue
- 1-4
- Journal Page Range
- p. 779-783
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 11. international conference on the physics of highly charged ions
- Dates
- 1-6 Sep 2002
- Place
- Caen (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34077557
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANGULAR DISTRIBUTION; ARGON IONS; CRYSTAL LATTICES; EXCITATION; HEAVY IONS; ION CHANNELING; MULTICHARGED IONS; POLARIZATION; SILICON; STARK EFFECT; WAVE FUNCTIONS; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- CHANNELING; CHARGED PARTICLES; CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; DISTRIBUTION; ELEMENTS; ENERGY-LEVEL TRANSITIONS; FUNCTIONS; IONS; NONDESTRUCTIVE ANALYSIS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.