Published May 2003 | Version v1
Journal article

Angular distribution of X-ray emission from resonant coherently excited highly-charged heavy ions

Description

X-rays emitted from resonant coherently excited (RCE) n=2 states of 390 MeV/amu hydrogen-like Ar17+ ions were observed under planar channeling in a Si crystal. The resonance profiles for X-ray emission consisting of two peaks for j=1/2 and j=3/2 are characterized by suppression of the j=1/2 peak. The degeneracy of the n=2 states are removed by Stark effect due to the static crystal field. The RCE probability of these Stark splitted substates differs, reflecting the polarization of the oscillating crystal field. However, the associated alignment was not clearly observed. It is explained by the fact that both polarization of the oscillating crystal field and the wave functions of Stark-mixed n=2 states depend on the distance from the channel center, and the X-ray emission is preferred in a channel center in a crystal

Additional details

Identifiers

PII
S0168583X03005767;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
205
Journal Issue
1-4
Journal Page Range
p. 779-783
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
11. international conference on the physics of highly charged ions
Dates
1-6 Sep 2002
Place
Caen (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34077557
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANGULAR DISTRIBUTION; ARGON IONS; CRYSTAL LATTICES; EXCITATION; HEAVY IONS; ION CHANNELING; MULTICHARGED IONS; POLARIZATION; SILICON; STARK EFFECT; WAVE FUNCTIONS; X-RAY EMISSION ANALYSIS
Descriptors DEC
CHANNELING; CHARGED PARTICLES; CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; DISTRIBUTION; ELEMENTS; ENERGY-LEVEL TRANSITIONS; FUNCTIONS; IONS; NONDESTRUCTIVE ANALYSIS; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.