Published 1986 | Version v1
Book

The theory of the preferential sputtering of alloys, including the role of Gibbsian segregation

  • 1. IBM Watson Research Center, Yorktown Heights, NY (USA)

Description

Preferential sputtering of alloys leads, not to a profile showing a simple depletion of one component starting at the surface, but to a more complicated situation in which the outermost atom layer shows a composition spike of one component while a depleted region begins at atom layer two. At steady state, the composition spike is governed by a conservation relation which equates the ratio of the sputtered fluxes (taking into account both mass and binding effects) to the ratio of bulk compositions. The steady-state second-atom-layer composition is determined by a relation similar to that for equilibrium Gibbsian segregation, but with the segregation ratio governed by a kinetic quantity rather than a thermodynamic one. Beyond the second atom layer there is a composition profile ideally describable (for bombardments at or below ambient temperature) by ion-beam mixing theory, but which can be shown also to admit a tractable diffusion approximation. (Auth.)

Additional details

Publishing Information

Publisher
Martinus Nijhoff.
Imprint Place
Dordrecht (Netherlands)
ISBN
90-247-3358-8
Imprint Title
Erosion and growth of solids stimulated by atom and ion beams
Imprint Pagination
476 p.
Journal Issue
no.112
Series
NATO ASI Series.;Series E: Applied Sciences.
Journal Page Range
p. 41-69.

Conference

Title
NATO Advanced Study Institute on erosion and growth of solids stimulated by atom and ion beams.
Dates
16-27 Sep 1985.
Place
Heraklion, Crete (Greece).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
18038573
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALLOYS; CHEMICAL COMPOSITION; ION BEAMS; QUANTITATIVE CHEMICAL ANALYSIS; SEGREGATION; SPUTTERING
Descriptors DEC
BEAMS; CHEMICAL ANALYSIS

Optional Information

Notes
109 refs.