Deuterium diffusion and retention in a tungsten–carbon multilayer system
Creators
- 1. State Key Laboratory of Solid Lubrication, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences, Lanzhou 730000 (China)
- 2. Max-Planck-Institut für Plasmaphysik, Boltzmannstr. 2, 85748 Garching (Germany)
Description
A tungsten–carbon multilayer system deposited by magnetron sputtering was used as a model system to study deuterium diffusion in tungsten, carbon and related carbides. After deposition the as-deposited multilayer films were annealed at different temperatures to achieve different structures. The structural changes due to annealing were investigated by Rutherford backscattering spectrometry and X-ray diffraction. The results show that diffusion and interaction between tungsten and carbon sets in at 1150 K. Different types of tungsten carbides including WC and W2C were formed during different heat treatments. Deuterium implantation experiments proved that deuterium diffusion in this multilayer system can be reduced substantially by formation of the tungsten carbide WC and can be almost completely suppressed by formation of the tungsten subcarbide W2C
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2014.03.007Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2014.03.007;
- PII
- S0168-583X(14)00435-2;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 329
- Journal Page Range
- p. 6-13
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46023631
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANNEALING; CARBON; DEPOSITION; DEPOSITS; DEUTERIUM; FILMS; INTERACTIONS; LAYERS; MAGNETRONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTERING; TUNGSTEN; TUNGSTEN CARBIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; HEAT TREATMENTS; HYDROGEN ISOTOPES; ISOTOPES; LIGHT NUCLEI; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONMETALS; NUCLEI; ODD-ODD NUCLEI; REFRACTORY METAL COMPOUNDS; REFRACTORY METALS; SCATTERING; SPECTROSCOPY; STABLE ISOTOPES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; TUNGSTEN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.