Published November 25, 1991
| Version v1
Journal article
Evolution and control of ion-beam divergence in applied-B diodes
Creators
- 1. Sandia National Laboratories, Albuquerque, New Mexico (USA)
Description
The time evolution of beam divergence induced by electomagnetic instabilities in applied-B ion diodes is examined using the 3D particle-in-cell code QUICKSILVER. The evolution is generally characterized by a high-frequency, low-divergence phase, associated with the diocotron mode, followed by a low-frequency, high-divergence phase, associated with the two-stream-like ion mode. Limiting the extent of the electron density profile evolution allows the diocotron phase to be sustained with a resulting divergence of ∼10 mrad
Additional details
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 67
- Journal Issue
- 22
- Series
- Phys. Rev. Lett.
- Journal Page Range
- 3094-3097
- ISSN
- 0031-9007
- CODEN
- PRLTA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23024383
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- COORDINATES; CURRENT DIVERGENCES; ELECTROMAGNETISM; ELECTRON DENSITY; FREQUENCY DEPENDENCE; GEOMETRY; INERTIAL CONFINEMENT; ION BEAMS; OPTIMIZATION; PLASMA INSTABILITY; Q CODES; THEORETICAL DATA; THERMIONIC DIODES; THREE-DIMENSIONAL CALCULATIONS; TIME DEPENDENCE
- Descriptors DEC
- BEAMS; COMPUTER CODES; CONFINEMENT; DATA; DIODE TUBES; ELECTRON TUBES; INFORMATION; INSTABILITY; MAGNETISM; MATHEMATICS; NUMERICAL DATA; PLASMA CONFINEMENT; THERMIONIC TUBES