Published 1900
| Version v1
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Thin dE/dx detectors of uniform thickness made on epitaxial silicon
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.Files
5112862.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 10 p.
- Report number
- FRNC-R--33
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 5112862
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- EPITAXY; FABRICATION; PERFORMANCE; SI SEMICONDUCTOR DETECTORS; SURFACE BARRIER DETECTORS; THICKNESS
- Descriptors DEC
- DIMENSIONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS