Published July 1984
| Version v1
Journal article
Influence of ion irradiation on the concentration of paramagnetic centers in a-Si films deposited in vacuum
- 1. Antanas Snechkus Polytechnic Institute, Kaunas
Description
A study was made of the influence of ion irradiation on the concentration of paramagnetic centers in a-Si films formed by vacuum deposition. It was found that controlled ion irradiation during deposition increased the concentration of paramagnetic centers with the g factor of 2.006 when the ratio of the fluxes of the ions and deposited material was in the range F/sub i//F/sub k/ = 0--0.02, whereas in the range F/sub i//F/sub k/>0.025 the concentration of paramagnetic centers reached saturation and was 2--2.5 times higher than for a film deposited without additional irradiation
Additional details
Publishing Information
- Journal Title
- Sov. Phys. - Semicond. (Engl. Transl.)
- Journal Volume
- 18
- Journal Issue
- 7
- Series
- Sov. Phys. - Semicond. (Engl. Transl.).
- Journal Page Range
- 745-746
- ISSN
- 0038-5700
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 16049739
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMORPHOUS STATE; EXPANSION; IONS; PARAMAGNETISM; PHYSICAL RADIATION EFFECTS; QUANTITY RATIO; SILICON; THIN FILMS
- Descriptors DEC
- CHARGED PARTICLES; ELEMENTS; FILMS; MAGNETISM; RADIATION EFFECTS; SEMIMETALS
Optional Information
- Notes
- Cover-to-cover translation of Fizika i Tekhnika Poluprovodnikov (USSR).