Published October 17, 1974
| Version v1
Patent
Open
Method of multielementary X-ray radiometric analysis using a spectrometer
Description
The sensitive and precision method of multielementary X-ray radiometric analysis using a spectrometer is developed. This method presupposes that the intensity of analytical lines is measured on the probe under analysis and according to these lines the concentration of the analyzed elements is determined. Preliminarily the energetic distribution of the radiation detector impulses from every line is measured, the coefficients of the background contributions are determined and the background of the analyzed probe is calculated. The coefficients of the background contribution are determined with two different integral loads of the spectrometer
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Additional details
Additional titles
- Original title (Russian)
- Способ многоэлементного рентгенора диометрического анализа спектрометром
Publishing Information
- Imprint Pagination
- 2 p.
- IPC:
- Int. Cl. G01N23/22.
- IPC
- Int. Cl. G01N23/22.
- Patent number
- SU patent document 529397/A/
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 10420206
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ACCURACY; RADIATION SCATTERING ANALYSIS; RADIOMETRIC ANALYSIS; SENSITIVITY; SPECTROMETERS; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHEMICAL ANALYSIS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; SPECTROSCOPY