Published September 11, 2016
| Version v1
Journal article
Soft X-ray detection and photon counting spectroscopy with commercial 4H-SiC Schottky photodiodes
Creators
Description
The results of electrical characterisation and X-ray detection measurements of two different active area (0.06 mm2 and 0.5 mm2) commercial 4H-SiC Schottky photodiodes at room temperature are reported. The devices exhibited low dark currents (less than 10 pA) even at a high electric field strengths (403 kV/cm for 0.06 mm2 diodes; 227 kV/cm for 0.5 mm2 diodes). The results of the X-ray measurements indicate that the diodes can be used as photon counting spectroscopic X-ray detectors with modest energy resolutions: FWHM at 5.9 keV of 1.8 keV and 3.3 keV, for the 0.06 mm2 and 0.5 mm2 devices, respectively. Noise analysis of the photodiodes coupled to a custom low noise charge sensitive preamplifier is also presented.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2016.05.053Additional details
Identifiers
- DOI
- 10.1016/j.nima.2016.05.053;
- PII
- S0168-9002(16)30443-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 830
- Journal Page Range
- p. 1-5
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48009108
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTRIC FIELDS; ENERGY RESOLUTION; KEV RANGE 01-10; NOISE; PHOTODIODES; PHOTONS; PREAMPLIFIERS; SCHOTTKY BARRIER DIODES; SOFT X RADIATION; SPECTROSCOPY; TEMPERATURE RANGE 0273-0400 K; X-RAY DETECTION
- Descriptors DEC
- AMPLIFIERS; BOSONS; DETECTION; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; ENERGY RANGE; EQUIPMENT; IONIZING RADIATIONS; KEV RANGE; MASSLESS PARTICLES; RADIATION DETECTION; RADIATIONS; RESOLUTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TEMPERATURE RANGE; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.