Published February 2000
| Version v1
Journal article
X-ray measurement of ICF target using surface profiler scanning
Creators
- 1. Institute of Nuclear Physics and Chemistry, CAEP, Mianyang (China)
Description
The X-ray radiography technique for measurement of ICF targets is introduced. Record film images of microspheres using contact microradiography. Analysis the X-ray images using surface profiler, direct measuring the wall thickness of single-wall microsphere. Compared this measurement with the optical interferometric measurement and found measurement differences <0.3 μm
Additional details
Publishing Information
- Journal Title
- High Power Laser and Particle Beams
- Journal Volume
- 12
- Journal Issue
- 1
- Journal Page Range
- p. 69-71
- ISSN
- 1001-4322
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 31032082
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ICF DEVICES; IMAGES; INTERFEROMETRY; MICRORADIOGRAPHY; MICROSPHERES; TARGETS; X RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; THERMONUCLEAR DEVICES