Monte Carlo simulation of multiple inelastic scatterings in crystals

Electron diffraction patterns and electron microscopic images from thick crystals have resulted from multiple inelastic scattering. Part of inelastic scattering can be considered to be independent process. The Monte Carlo method is applied to Bloch wave scattering in the two-beam approximation. The result of the calculation on the wave point distribution on the dispersion surface and the transmission intensity indicates that the method is useful for some problems in electron diffraction and microscopy. (auth.)