Published 2002
| Version v1
Miscellaneous
The use of software in x-ray diffraction
Description
Full text: X-ray diffraction has become an invaluable tool for the analysis of a large group of materials. Recent developments in hardware and software make the technique accessable for a large group of users ranging from specialists at universities for research purposes to factory operators for routine process control. This lecture will focus on the use of software in X-ray diffraction for data collection and subsequent analysis. Attention will be paid to a variety of applications, such as phase analysis, Rietveld analysis and routine process control. Copyright (2002) Australian X-ray Analytical Association Inc
Additional details
Publishing Information
- Imprint Title
- The National Conference and Exhibition of the Australian X-ray Analytical Association Inc
- Imprint Pagination
- 210 p.
- Journal Page Range
- p. 60
Conference
- Title
- AXAA 2002. Analytical X-ray for Industry and Science
- Dates
- 11-15 Feb 2002
- Place
- Newcastle, NSW (Australia)
INIS
- Country of Publication
- Australia
- Country of Input or Organization
- Australia
- INIS RN
- 34032597
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- COMPUTER CODES; DATA ACQUISITION SYSTEMS; DATA ANALYSIS; PHASE STUDIES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; SCATTERING