Published September 1, 1974 | Version v1
Journal article Metadata-only

Time resolution in X-ray - heavy-ion coincidence measurements as a function of the X-ray energy

Creators

  • 1. Max-Planck-Institut fuer Kernphysik, Heidelberg (F.R. Germany)

Description

no abstract available

Additional details

Identifiers

DOI
10.1016/0029-554x(74)90054-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
120
Journal Issue
2
Series
Nucl. Instrum. Methods.
Journal Page Range
329-332
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
6163442
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COINCIDENCE METHODS; DIFFERENTIAL CROSS SECTIONS; ELECTRONIC STRUCTURE; ENERGY DEPENDENCE; HEAVY IONS; INTERNAL IONIZATION; ION DETECTION; KEV RANGE 01-10; KEV RANGE 10-100; LI-DRIFTED SI DETECTORS; MULTI-CHANNEL ANALYZERS; SPECTRA; SURFACE BARRIER DETECTORS; TIME RESOLUTION; X-RAY DETECTION
Descriptors DEC
CHARGED PARTICLE DETECTION; CHARGED PARTICLES; COUNTING TECHNIQUES; CROSS SECTIONS; ELECTRONIC EQUIPMENT; ENERGY RANGE; IONIZATION; IONS; KEV RANGE; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; PULSE ANALYZERS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; TIMING PROPERTIES

Optional Information

Notes
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