Published November 2011 | Version v1
Journal article

Synthesis,Structure and Electrical Properties of(SnO2)x(In2O3)1−x(x=0.5–1) Nanocomposites

  • 1. Voronezh State Technical University (Russian Federation)
  • 2. North Caucasus State Technical University (Russian Federation)

Description

The experimental results of synthesizing thin films (<1 μm thick) of (SnO2)x(In2O3)1−x (x = 0.5–1 wt) nanocomposites fabricated by high-frequency magnetron sputtering of metal-oxide targets in a controlled Ar + O2 atmosphere are presented. The films, deposited on hot substrates (400°C), are studied by the X-ray diffraction analysis, atomic-force microscopy, and optical and electrical methods. The effect of the synthesis conditions and film composition on the size of crystalline grains, band gap, and the concentration and mobility of free charge carriers was determined. It is shown that films of the composition (SnO2)x(In2O3)1−x with x = 0.9 are the most promising for applications in gas sensorics.

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductors
Journal Volume
45
Journal Issue
11
Journal Page Range
p. 1479-1482
ISSN
1063-7826
CODEN
SMICES

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Copyright
Copyright (c) 2011 Pleiades Publishing, Ltd.