Published November 2011
| Version v1
Journal article
Synthesis,Structure and Electrical Properties of(SnO2)x(In2O3)1−x(x=0.5–1) Nanocomposites
- 1. Voronezh State Technical University (Russian Federation)
- 2. North Caucasus State Technical University (Russian Federation)
Description
The experimental results of synthesizing thin films (<1 μm thick) of (SnO2)x(In2O3)1−x (x = 0.5–1 wt) nanocomposites fabricated by high-frequency magnetron sputtering of metal-oxide targets in a controlled Ar + O2 atmosphere are presented. The films, deposited on hot substrates (400°C), are studied by the X-ray diffraction analysis, atomic-force microscopy, and optical and electrical methods. The effect of the synthesis conditions and film composition on the size of crystalline grains, band gap, and the concentration and mobility of free charge carriers was determined. It is shown that films of the composition (SnO2)x(In2O3)1−x with x = 0.9 are the most promising for applications in gas sensorics.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 45
- Journal Issue
- 11
- Journal Page Range
- p. 1479-1482
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43094798
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CHARGE CARRIERS; COMPOSITE MATERIALS; ELECTRICAL PROPERTIES; INDIUM OXIDES; MAGNETRONS; METALS; MOBILITY; NANOSTRUCTURES; SPUTTERING; SUBSTRATES; SYNTHESIS; THIN FILMS; TIN OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; INDIUM COMPOUNDS; MATERIALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Pleiades Publishing, Ltd.