Published November 2003 | Version v1
Journal article

Simulation of the molecular recombination yield for swift H2+ ions through thin carbon foils

  • 1. Departamento de Fisica, Universidad de Murcia, Apartado 4021, E-30080 Murcia (Spain)

Description

We have calculated the recombination yield for swift H2+ molecular ions at the exit of thin amorphous carbon foils, as a function of the dwell time and incident energy. Our results are based on a detailed simulation of the motion through the target of the H2+ molecular ion (before dissociation takes place) and its constituent fragments (after dissociation), including the following effects: Coulomb repulsion, nuclear scattering, electron capture and loss, as well as self-retarding and wake forces, which provide the relative distance and velocity of the dissociated fragments at the foil exit. The recombination of an H2+ ion at the exit of the foil depends on the interproton separation and internal energy of the dissociated fragments, and on their probability to capture an electron. Comparison of our results with the available experimental data shows a good agreement

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. A
Journal Volume
68
Journal Issue
5
Journal Page Range
p. 054901-054901.4
ISSN
1050-2947
CODEN
PLRAAN

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35055283
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
CARBON; COMPUTERIZED SIMULATION; COULOMB FIELD; DISSOCIATION; ELECTRON CAPTURE; ELECTRONS; ENERGY LOSSES; EXPERIMENTAL DATA; FOILS; HYDROGEN IONS; MOLECULAR IONS; RECOMBINATION; YIELDS
Descriptors DEC
CAPTURE; CHARGED PARTICLES; DATA; ELECTRIC FIELDS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; INFORMATION; IONS; LEPTONS; LOSSES; NONMETALS; NUMERICAL DATA; SIMULATION

Optional Information

Notes
(c) 2003 The American Physical Society