Published 2015 | Version v1
Book Metadata-only

Bias dependence of the energy resolution in planar HPGe detectors for low energy X-rays

Creators

  • 1. National Research Nuclear Univ. MEPhI - Moscow Engineering Physics Inst., Moscow (Russian Federation)

Description

no abstract available

Part of:
LXV International conference NUCLEUS 2015. New horizons in nuclear physics, nuclear engineering, femto- and nanotechnologies (LXV Meeting on nuclear spectroscopy and nuclear structure). Dedicated to 60th anniversary of the Joint Institute for Nuclear Research. Book of abstracts

Additional details

Publishing Information

Publisher
SPbSU
Imprint Place
Saint-Petersburg (Russian Federation)
ISBN
978-5-9651-0907-4
Imprint Title
LXV International conference NUCLEUS 2015. New horizons in nuclear physics, nuclear engineering, femto- and nanotechnologies (LXV Meeting on nuclear spectroscopy and nuclear structure). Dedicated to 60th anniversary of the Joint Institute for Nuclear Research. Book of abstracts
Imprint Pagination
323 p.
Journal Page Range
p. 260

Conference

Title
65. International Conference NUCLEUS 2015
Dates
29 Jun - 3 Jul 2015
Place
Saint-Petersburg (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
48051808
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract, Conference, Numerical Data
Descriptors DEI
AMPLITUDES; CARRIER LIFETIME; CHARGE CARRIERS; ELECTRIC POTENTIAL; ELECTRON MOBILITY; ENERGY RESOLUTION; HIGH-PURITY GE DETECTORS; KEV RANGE 01-10; POWER SERIES; SIGNALS; STOCHASTIC PROCESSES; THEORETICAL DATA; X-RAY DETECTION
Descriptors DEC
DATA; DETECTION; ENERGY RANGE; GE SEMICONDUCTOR DETECTORS; INFORMATION; KEV RANGE; LIFETIME; MEASURING INSTRUMENTS; MOBILITY; NUMERICAL DATA; PARTICLE MOBILITY; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SERIES EXPANSION

Optional Information