Published January 31, 2001
| Version v1
Journal article
Electromigration of copper in Al(0.25 at.% Cu) conductor lines
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 89
- Journal Issue
- 5
- Journal Page Range
- [10 p.]
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 33068356
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ALUMINIUM BASE ALLOYS; COPPER; COPPER ADDITIONS; ELECTRIC CABLES; ELECTROPHORESIS
- Descriptors DEC
- ALLOYS; ALUMINIUM ALLOYS; CABLES; CONDUCTOR DEVICES; COPPER ALLOYS; ELECTRICAL EQUIPMENT; ELEMENTS; EQUIPMENT; METALS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Contract/Grant/Project number
- AC02-98CH10886
- Funding organization
- USDOE Office of Energy Research (ER) (United States)